i | Title of the course | MM 734 - Electrical Characterization of Materials ? |
ii | Credit structure | L????????? T????????? P????????? C 3 ? ? ? ? ? 0 ? ? ? ? ?0? ? ? ? ? ?3 ? |
iii | Pre-requisite, if any | None ? |
iv | Course content | Conductivity measurements (bulk and thin films) ?? 2 and 4 probe measurements in metals, semiconductors and insulators. Hall effect, mobility, carrier concentration measurements. AC measurements ?? impedance and dielectric. Various sources ?? grain, grain boundary, space charge, electron. Activation energy. Optical measurements ?? band gap in semiconductors. Absorption measurements, photoconductivity, photoluminescence for defects. Ellipsometry. Work function measurement ?? UPS, metal-semiconductor contacts, Kelvin probe. IR and Raman spectroscopy. Ferro-electric and ferro-magnetic measurements. ? |
v | Texts/References | Peter Stallinga, Electrical Characterization of Organic Electronic Materials and Devices, Wiley,NJ, 2009Laszlo Solymar, Donald Walsh, Electrical Properties of Materials, Oxford University Press, 8thEd., 2010 |
vi | Instructor(s) name | Prof. Ajit Kulkarni |