i

Title of the course

MM 732: Structural Characterization of Materials

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Credit structure

L????????? T????????? P????????? C

0?????????? 0????????? 3?????????? 3

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Pre-requisite, if any

None

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Course content

Optical microscopy ?? different modes of microscopy, image analysis Scanning electron microscopy ?? secondary electron and backscattered electron imaging, EDS/EPMA X-ray diffraction ?? indexing of XRD patterns, Intensity calculations, particle size effects, lattice parameter determination

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Texts/References

B. D. Cullity and S. R. Stock, Elements of X-ray Diffraction, Prentice Hall; 3 ed., 2001R. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, andAEM, Springer, 1st ed. 2005R. Haynes, Optical Microscopy of Materials, Springer, 1984

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Instructor(s) name

Prof. Ashutosh Gandhi